STRUCTURAL AND OPTICAL CHARACTERIZATION OF ZnO FILMS DOPED WITH Ni

Authors

  • M. TOMA Babes-Bolyai University, Physics Faculty, M. Kogalniceanu No.1, 400084, Cluj-Napoca, Romania; Research Center for Advanced Medicine Iuliu Hatieganu University of Medicine and Pharmacy, 400337, Cluj-Napoca, Romania. mary02.toma@gmail.com
  • C. LUNG Babes-Bolyai University, Physics Faculty, M. Kogalniceanu No.1, 400084, Cluj-Napoca, Romania
  • D. MARCONI Babes-Bolyai University, Physics Faculty, M. Kogalniceanu No.1, 400084, Cluj-Napoca, Romania; Department of Molecular and Biomolecular Physics, National Institute for Research and Development of Isotopic and Molecular Technologies, Cluj-Napoca, Romania
  • A. POP Babes-Bolyai University, Physics Faculty, M. Kogalniceanu No.1, 400084, Cluj-Napoca, Romania

DOI:

https://doi.org/10.24193/subbphys.2018.08

Keywords:

XRD, transmittance, Ni-ZnO thin films, RF magnetron sputtering

Abstract

Zinc oxide (ZnO), and Ni-doped ZnO (NZO) thin films were deposited on glass substrates by radio frequency (RF) magnetron sputtering for three different distances between substrate-target. The influence of the distance between substrate-target upon structure of the thin films was analyzed by X-ray diffraction (XRD) and the grain size was determined by theoretical calculations. Optical transmission measurements show the influence of doping and distance between substrate-target on the optical band gap.

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STUDIA UBB PHYSICA, Volume 63 (LXIII), No. 1-2, December 2018

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Published

2018-12-30

How to Cite

TOMA, M., LUNG, C., MARCONI, D., & POP, A. (2018). STRUCTURAL AND OPTICAL CHARACTERIZATION OF ZnO FILMS DOPED WITH Ni. Studia Universitatis Babeș-Bolyai Physica, 63(1-2), 89–99. https://doi.org/10.24193/subbphys.2018.08

Issue

Volume 63, No. 1-2, 2018

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Articles

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